GONG, H. Hierarchical Bayesian Defect Localization under Test and Inspection Constraints. Journal of Computational Methods in Engineering Applications, [S. l.], v. 6, n. 1, p. 0004, 2026. DOI: 10.62836/jcmea.v6i1.0004. Disponível em: https://ojs.sgsci.org/journals/jcmea/article/view/725. Acesso em: 11 nov. 2026.